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A novel direct structured-light inspection technique for contaminant and defect detection

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Document pages: 4 pages

Abstract: The Direct Structured-Light Inspection Technique (DSIT) proposed in thispaper is a novel method that can be implemented under two types of binarystructured light illumination to detect contaminants and defects on specularsurfaces and transparent objects, in which light reflection system is used todetect specular surfaces, while light transmission system is applied fortransparent object inspection. Based on this technique, contaminant and defectdistribution can be directly obtained without any calculation process. Relevantsimulations and experiments are performed to prove the effectiveness of DSIT.

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