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Effect of temperature on typical texture distribution of primary recrystallized matrix of 3% Si CGO silicon steel

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Document pages: 6 pages

Abstract: The microstructure and texture distribution of CGO silicon steel during primary recrystallization at different intermediate annealing temperatures were studied by optical microscope (OM) and electron backscatter diffraction (EBSD). The effect of intermediate annealing temperature on texture distribution of 3 Si electrical steel was analyzed. The results show that the primary recrystallization matrix of CGO silicon steel is equiaxed ferrite grain. The average grain size of primary recrystallization increases with the increase of intermediate annealing temperature. γ Fiber texture is the main component of primary recrystallization matrix. The higher the intermediate annealing temperature, the larger the texture and texture, and the stronger the texturetexture. Goss texture was observed to be decreased firstly and then increased. The content of high angle grain boundaries in primary recrystallization matrix are affected by intermediate annealing temperature. When intermediate annealing temperature is increased, high angle grain boundaries are increased firstly and then decreased. Misorientation distribution in primary recrystallized matrix is affected by primary recrystallization annealing temperature either. The content of high angle grain boundaries are increased owing to higher primary recrystallization annealing temperature, which can be a benefit to the abnormal growth of Goss grains in secondary recrystallization.

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