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Effect of stress on density of states of amorphous carbon films measured by X-ray excited Auger electron spectroscopy

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Document pages: 5 pages

Abstract: Amorphous carbon films can be prepared with a variety of structures and have been applied in many technical applications. Many of their properties have been identified, but little is known about the impact of pressure on their properties. In this work, the effect of pressure on the density of states (DOS) of graphite like amorphous carbon films was studied by X-ray excited Auger electron spectroscopy (XAES) and the second derivative method of XAES. The film was deposited by ion beam deposition and bombarded with argon, which is the reason for the change of film stress, reaching a very high value (4.5   GPA). With the increase of stress, the density of states of, SP and s components changed significantly.

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