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XPS Study of LSCF interface after battery test

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Document pages: 6 pages

Abstract: The purpose of this study is to explore the possibility of using the depth profile function of XPS to study the interface after SOFC button battery test. XPS is used to study various cathode materials in the literature, but few people understand various cathode interfaces, especially after testing. In this work, the SOFC button battery was tested first, and then the LSCF cathode, barrier layer and electrolyte were sputtered to study the behavior of different interfaces. This work shows that some elements have been transferred to other layers of SOFC battery. It is believed that the migration of elements is partly due to the redeposition mechanism after atomic sputtering, while the rest is due to the mutual diffusion between SDC and YSZ layers. However, additional Wrk is needed to better understand the mechanism by which atoms move around at different interfaces. The cell electrochemical performance is also discussed in some details but is not the focus.

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