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Implementation of LPT Using Spider Technique

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Document pages: 6 pages

Abstract: A LP broad side test set is designed from a functional broadside set with the derivation of skewed-load test cubes in Built in Self Test circuits. In order to cope up with the functional operation criteria, our work concentrates on the percentage of values indefinite values in the tests performed. The double effect of programmable truncated multiplication and fault tolerant Digital Signal processing (DSP) design is put on to reduce voltage beyond critical timing level. Timing modulations properties of truncated multiplication are are examined for the betterment of fault tolerant designs, reducing error correction burdens, and extending the system operating voltage range. The lower power test schemes along with Razor technique is implemented with the original DSP. Only drawback is the degradation of the output signal-to-noise ratio.

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